*001528985
*00520250613133829.0
*007cr
*007ta
*008121213s1991 no 000 u mul
*00901252cam a2200325 c 4500
*019 $bl
*020 $a8259564297
*035 $a(EXLNZ-47BIBSYS_NETWORK)999111449354702201
*035 $a(NO-LaBS)13714915(bibid)
*035 $a(NO-TrBIB)122624874
*035 $a(NO-TrBIB)911144935
*035 $a911144935-47bibsys_network
*040 $aNO-OsNB$bnob$ekatreg
*041 $aeng$anob
*080 $a621.3.049.77.001.4
*080 $a621.38.001.4
*1001 $aNystu, Gunnar$0(NO-TrBIB)90546512$_81655700
*24510$aPLA testing in deterministic or probabilistic mode, and applications in self-test environments$cGunnar Nystu and Einar J. Aas
*260 $aTrondheim$bSINTEF, DELAB$c1991
*300 $a48 bl. (flere fol.)$bfig.
*4901 $aSINTEF-DELAB report$vSTF40 A91084
*533 $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2012-09-04
*650 7$aElektronikk$xPrøving$2tekord$_188675500
*650 7$aintegrerte$akretser$aprøving$2tekord$_188675600
*7001 $aAas, Einar J.$d1943-$0(NO-TrBIB)90077458$_30035500
*830 0$aSINTEF-DELAB rapport (trykt utg.)$vSTF40 A91084$w999110210434702201$_13324500
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2012090408187$yNettbiblioteket$zDigital representasjon
*901 $a80
*999 $aoai:nb.bibsys.no:999111449354702202$b2021-11-14T20:28:03Z$z999111449354702202
^