*001306310
*00520190416201955.0
*007ta
*008131031s2008    no#           000 0 eng
*00901360cam a2200325 c 4500
*015  $a0815347$2nbf
*019  $bl
*020  $qh.
*035  $a(EXLNZ-47BIBSYS_NETWORK)990823690704702201
*035  $a(NO-LaBS)14670623(bibid)
*035  $a(NO-TrBIB)082369070
*035  $a082369070-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*042  $anorbibl
*044  $cno
*08274$a621.381$qNO-OsNB$25/nor
*1001 $aJohannessen, Rolf$d1962-$0(NO-TrBIB)8067438$_57936100
*24510$aReliable microelectronics for harsh environment applications :$beffects of thermal stress and high pressure$cby Rolf Johannessen
*260  $aOslo$bFaculty of Mathematics and Natural Sciences, University of Oslo$bUnipub$c2008
*300  $aXII, 50 s.$bill.
*4901 $aSeries of dissertations submitted to the Faculty of Mathematics and and Natural Sciences$vnr. 769
*502  $aAvhandling (ph.d) - Universitetet i Oslo, 2008
*650 7$aElektronikk$0(NO-TrBIB)REAL000162$2noubomn$_185742400
*650 7$aFysikk$0(NO-TrBIB)REAL003067$2noubomn$_185645000
*653  $adoktoravhandlinger$afysikk$amikroelektronikk$ahøytrykk$atermisk$abelastning$_57936200
*830 0$aSeries of dissertations submitted to the Faculty of Mathematics and Natural Sciences, University of Oslo (trykt utg.)$x1501-7710$vnr. 769$w999916000704702201$_204427900
*901  $a90
*913  $aNorbok$bNB
*917  $ad
*999  $aoai:nb.bibsys.no:990823690704702202$b2021-11-14T20:09:36Z$z990823690704702202
^