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*080  $a669.715
*24500$aQuantitative analysis in the Al-Mg-Si system with small amounts of Mg and Si$cYan Tang ... [et al.]
*260  $aTrondheim$bSINTEF, Applied Physics$c1993
*300  $aBl. 325-326$bfig.
*4901 $aSINTEF report$vSTF19 A92031
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2017-01-23
*534  $aFotokopi av: European Congress on Electron Microscopy (1992 : Granada). Electron microscopy. B. 1
*650 7$aAluminiumlegeringer$2tekord$_186602400
*7001 $aTang, Yan$0(NO-TrBIB)90679359$_45482100
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A92031$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2017012348105$yNettbiblioteket$zDigital representasjon
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*999  $aoai:nb.bibsys.no:999303548264702202$b2021-11-14T20:58:06Z$z999303548264702202
^