*0011076799
*00520190130103550.0
*007ta
*008120625s2010    xx#    f      000 u eng d
*00900872caa a2200217 c 4500
*019  $bk
*035  $a(EXLNZ-47BIBSYS_NETWORK)991020506944702201
*035  $a(NO-TrBIB)102050694
*035  $a102050694-47bibsys_network
*040  $aNO-TrBIB$bnob$ekatreg
*1001 $aMolinuevo, Javier Toral$0(NO-TrBIB)10064409$4aut$_127853600
*24512$aA bee colony algorithm (BCA) approach for inspection of printed circuit board$cJavier Toral Molinuevo and Kesheng Wang
*260  $c2010
*300  $aS. 119-126
*7001 $aWang, Kesheng$d1945-$0(NO-TrBIB)90283384$4aut$_14930000
*7730 $aInternational Workshop of Advanced Manufacturing and Automation(2010 Shanghai)$tInternational Workshop of Advanced Manufacturing and Automation$dTrondheim : IWAMA, cop. 2010$z9788251925181$w991018362284702201
*901  $a80
*914  $aScientific
*915  $a2
*999  $aoai:nb.bibsys.no:991020506944702202$b2021-11-02T03:19:51Z$z991020506944702202
^