*001452487
*00520250613134544.0
*007ta
*008930217r19931992no            000 0 eng
*00901344cam a2200301 c 4500
*019  $bl
*020  $a8259576503
*035  $a(EXLNZ-47BIBSYS_NETWORK)999303552454702201
*035  $a(NO-LaBS)14349363(bibid)
*035  $a(NO-TrBIB)930355245
*035  $a930355245-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*080  $a538.945
*1001 $aBardal, Asgeir$0(NO-TrBIB)90412836$_39705100
*24510$aInterfaces of YBa₂Cu₃O7-x thin films on Si substrates with yttrium stabilized zirconia yttria buffer layers$cA. Bardal, M. Zwerger and Ol Eibl
*260  $aTrondheim$bSINTEF, Applied Physics$c1993
*300  $aBl. 25-26$bill.
*4901 $aSINTEF report$vSTF19 A92032
*500  $aI tittelen: "7-x" i "O7-x" skal være nedsenket
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2017-01-23
*534  $aFotokopi av: European Congress on Electron Microscopy (10 : 1992 : Granada). Electron microscopy. B. 2
*650 7$aSupraledning$2tekord$_187233600
*7001 $aEibl, Oliver$0(NO-TrBIB)90643116$_41677000
*7001 $aZwerger, Markus$0(NO-TrBIB)90643115$_41677100
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A92032$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2017012348106$yNettbiblioteket$zDigital representasjon
*901  $a80
*999  $aoai:nb.bibsys.no:999303552454702202$b2021-11-14T20:21:53Z$z999303552454702202
^