*001236252
*00520250613133638.0
*007ta
*008910607s1991    no            000 0 eng
*00901014cam a2200253 c 4500
*019  $bl
*020  $a8259563460
*035  $a(EXLNZ-47BIBSYS_NETWORK)999104068394702201
*035  $a(NO-LaBS)13784724(bibid)
*035  $a(NO-TrBIB)910406839
*035  $a910406839-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*080  $a681.785.3
*24503$aAn Infrared ellipsometer for the study of surfaces, thin films and superlattices$cJ. Bremer ... [et al.]
*260  $aTrondheim$bSINTEF, Applied Physics$c1991
*300  $a21, [9] bl.$bill.
*4901 $aSINTEF report$vSTF19 A91004
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2016-12-12
*650 7$aEllipsometri$2tekord$_188290400
*7001 $aBremer, Johannes$0(NO-TrBIB)90069366$_16876300
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A91004$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2016121248528$yNettbiblioteket$zDigital representasjon
*901  $a80
*999  $aoai:nb.bibsys.no:999104068394702202$b2021-11-14T19:59:40Z$z999104068394702202
^