*001697569
*00520171205202718.0
*007ta
*008140804s2008 no# 000 0 eng
*00901923cam a2200433 c 4500
*015 $a0815358$2nbf
*019 $bl
*020 $qh.
*035 $a(EXLNZ-47BIBSYS_NETWORK)990805257684702201
*035 $a(NO-LaBS)13704963(bibid)
*035 $a(NO-TrBIB)080525768
*035 $a080525768-47bibsys_network
*040 $aNO-OsNB$bnob$ekatreg
*042 $anorbibl
*044 $cno
*08274$a620.5$qNO-OsNB$25/nor
*084 $aa6180j$qNoOU$2inspec
*084 $aa7155$qNoOU$2inspec
*084 $aa7920n$qNoOU$2inspec
*1001 $aVines, Lasse$d1975-$0(NO-TrBIB)2013665$_52053400
*24510$aFundamental defect complexes and nanostructuring of silicon by ion beams$cby Lasse Vines
*260 $a[Oslo]$bDepartment of Physics, Faculty of Mathematics and Natural Sciences, University of Oslo$bUnipub$c2008
*300 $a1 b. (flere pag.)$bill.
*4901 $aSeries of dissertations submitted to the Faculty of Mathematics and Natural Sciences, University of Oslo$vnr. 703
*502 $aAvhandling (ph.d) - Universitetet i Oslo, 2008
*650 7$aElektronikk$0(NO-TrBIB)REAL000162$2noubomn$_185742400
*650 7$aFysikk$0(NO-TrBIB)REAL003067$2noubomn$_185645000
*650 7$aGitterfeil$0(NO-TrBIB)REAL013909$2noubomn$_202679400
*650 7$aHalvledere$0(NoOU)REAL005740$2noubomn$_204040500
*650 7$aIoniserende stråling$0(NO-TrBIB)REAL031090$2noubomn$_204040600
*650 7$aNanostrukturerte materialer$0(NO-TrBIB)REAL002527$2noubomn$_203942300
*650 7$aStråling$0(NO-TrBIB)REAL009925$2noubomn$_185515800
*653 $adoktoravhandlinger$afysikk$aelektronikk$afysikalsk$ahalvlederfysikk$ananomaterialer$aioniserende$astråling$adefekter$_98239300
*7760 $tFundamental defect complexes and nanostructuring of silicon by ion beams$w990811339364702201
*830 0$aSeries of dissertations submitted to the Faculty of Mathematics and Natural Sciences, University of Oslo (trykt utg.)$x1501-7710$vnr. 703$w999916000704702201$_204427900
*901 $a90
*913 $aNorbok$bNB
*917 $ad
*999 $aoai:nb.bibsys.no:990805257684702202$b2021-11-14T20:42:51Z$z990805257684702202
^